Prof Steffen Duhm:Ultraviolet photoelectron spectroscopy elucidates the electronic structure of organic semiconductor thin films

发布日期:2016-04-25

报告题目:

Ultraviolet photoelectron spectroscopy elucidates the electronic structure of organic semiconductor thin films

报告人:

Prof Steffen Duhm

苏州大学

邀请人:

郝晓涛 教授

报告时间:

2013-12-06 15:45

报告地点:

知新楼C702 量子报告厅

报告内容提示:

In the last decades “Organic Electronics” is a rapidly emerging field of physics, chemistry and related science and organic electronic devices like light emitting diodes, field effect transistors or solar cells are entering the market. However, the mobilities of slightly disordered organic thin films are often rather poor and limit device performance. Moreover, the energy-level alignment at organic/organic and organic/inorganic interfaces, which are inherent to organic devices, is not understood in a sufficient way. Ultraviolet photoelectron spectroscopy (UPS) is an effective tool to get deep insight in the electronic structure at relevant interfaces. Moreover, complementary surface science techniques like the X-ray standing wave technique or X-ray photoelectron spectroscopy can give a comprehensive insight in organic/metal interfaces.

报告人简介:

2004 Diploma, Department of Physics, Humboldt-University Berlin, Germany

2008 PhD, Department of Physics, Humboldt-University Berlin

2008-2012 Postdoctoral research fellow, Graduate School of Advanced Integration Science, Chiba University, Japan

06/2012-present,Professor at FUNSOM, Soochow University

09/2012,“National Young 1000 Talents”Professor

His research is focused on functional hybrid organic/inorganic and organic/organic interfaces with angle-resolved ultraviolet photoelectron spectroscopy (ARUPS) as main experimental tool. The research resulted so far in more than 40 publications in SCI indexed journals like Nature Materials, Nature Chemistry, Physical Review Letters, Advanced Materials or Journal of the American Chemical Society. These publications are cited over 1200 times, resulting in an h-index of 18.

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